The Xstress Mini is the smallest X-ray diffraction analyzer in the Xstress -product line. The Xstress Mini is lightweight can be used to measure residual stresses for quality and process control. This unit is easily portable and ideal for measurements on-site, at the factory, or in the laboratory.
Fast, accurate, and repeatable analysis of crystalline materials
Quick and easy set up to expedite your measurement process and analysis
Box-like shape with a footprint smaller than a laptop